Highly Accelerated Stress Test System (HAST Chamber)

The HAST test chamber, specifically designed for semiconductors, IC packaging, and automotive electronics, rapidly induces latent defects through a high-temperature, high-pressure saturated steam environment, enabling accelerated aging and reliability verification.

Accelerate your reliability testing with our state-of-the-art Highly Accelerated Stress Test (HAST) Chamber. Engineered to simulate extreme temperature and humidity conditions, this system drastically reduces failure analysis time for semiconductors, IC packages, and electronic components.

• •Supports non-saturated and saturated steam modes to achieve high acceleration stress testing, significantly shortening traditional humidity-heat aging cycles.
• •Features a fully closed-loop temperature-humidity-pressure feedback system to ensure highly stable and repeatable test conditions.
• •The chamber employs high-strength stainless steel multi-layer welding construction, with standard mechanical safety valves, electronic overpressure protection, and bursting discs providing multiple layers of protection, meeting pressure vessel safety standards.
• •Supports HAST testing standards including JESD22-A110, JESD22-A118, and IPC-TM-650, with customizable testing solutions for optoelectronics, automotive-grade chips, and other applications.

The HAST High-Accelerated Stress Test Chamber primarily simulates extreme environments of high temperature, high humidity, and high pressure to rapidly evaluate the long-term reliability and moisture resistance of electronic products, particularly non-hermetically sealed devices:

• •Semiconductors and Integrated Circuits: Conduct accelerated temperature-humidity life testing and failure analysis for chips and packaged devices.
• •Automotive Electronics: Perform rigorous environmental reliability verification on automotive-grade chips, sensors, power modules, and other components.
• •Military and Aerospace: Evaluates long-term stability of high-reliability components and assemblies under extreme humid-heat conditions.
• •Communications and Optoelectronics: Screens communication products like optical modules and fiber devices for moisture resistance and long-term reliability.

SANWOOD Technology's HAST High-Accelerated Stress Test Chamber is primarily used for accelerated life testing of semiconductors, packaging, electronic components, and new materials under high-temperature, high-humidity, and high-pressure conditions. I

• •MIL-STD-810: Semiconductors/Integrated Circuits: JESD22-A110 (JEDEC High Accelerated Temperature and Humidity Stress Test Standard).
• •Automotive Electronics: AEC-Q100 / AEC-Q101 (Reliability Requirements for Automotive-Grade Chips and Discrete Devices).
• •ISO16750: Military/Aerospace: MIL-STD-883 Method 1004 (High Reliability Testing of Microelectronic Devices)
• •ISO2233: Communications/Consumer Electronics: Telcordia GR-468 / JESD22-A118 (Optical Device and General Reliability Testing).